Nova Integrated Metrology for Etch Deployed by a Major Foundry in Asia Pacific

Nova Measuring Instruments Ltd. provider of leading edge stand-alone metrology and the market leader of integrated metrology solutions to the semiconductor process control market, today announced that a major foundry in Asia Pacific has decided to deploy its NovaScan Integrated Metrology (IM) solution coupled with NovaMARS shape profiling software, for 45nm gate Etch Advanced Process Control.

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